Used Vitrek 954I Safety Compliance Analyzer, 11KVDC, 6KVAC/IR/GB/LR, El

Product Highlights

• Highest Level of Operator Safety - features include: GFI High speed shut down for earth ground leakage faults, SFI™ Safety Fault Interlock - High speed shut down output for interruption of safety interlock, TLSS™ Test Lead Safety Sense - Clamps DUT chassis near ground by continuously verifying proper connection of test leads prior to and during HV testing, Recessed start switch prevents inadvertent actuation
• High Power Output - means better drive capability and increased test throughout. With up to 50mA of sourcing current for DC hipot the 95X Series gets heavy duty jobs done fast - available 100mA & 200mA AC drive tackles even the toughest sourcing requirements
• Wide Range of built-in Voltage Capabilities - Choose from 6.5KVDC, 11KVDC or 15KVDC and 6KVAC, 10KVAC or up to 30KV RMS AC with external option
• The Fastest Hipot Testers available - Thanks to our Dual Coldfire® microprocessors combined with Dual DSPs to provide Ramp rates up to 50KV/second, dwell times as low as 20mS and overall test times as fast as 3mS in optional Flash mode
• Expansive Test Sequence Memory holds up to 100 tests with up to 100 steps per test. Tests can be selected via front panel, Ethernet, RS232, Digital I/O or with optional GPIB
• Ground Bond Test Capability available in three models with output currents from 100mA to 40Amps RMS and test times from 20mS to 1000 seconds or longer
• 4-Wire Milli-Ohmmeter Function provides fast, accurate 5 digit resistance measurements with resolution down to 100µΩ and range up to 100K ohms
• Built-in Phase Angle Measurement - allows the measurement and display of both resistive (in-phase) leakage current and reactive (out-of-phase) leakage current caused by capacitive coupling
• Multi-Dwell Functionality - permits dwells at different voltage levels without having to return to zero between test steps - dramatically simplifying advanced analysis of dielectric properties
• Ramp High/Dwell Low Current Limits - permits the user to set separate limits for the ramp and dwell providing faster ramp times and lower leakage test limits
• Ethernet, RS232, Digital I/O, USB Printer & Scanner Control - All Standard Interfaces - Provides the highest level of test automation. GPIB optional
• High Voltage Scanner Control - up to 256 point switching capability with available 964i HV Scanners. Route voltages up to 15KV and currents up to 40A for multi-point hipot and ground bond tests
• Dual Dimensional / Test Specific / Broadband Arc Detection. Where lesser testers allow you to set a single, global, amplitude only arc limit - the technologically advanced 95X Series utilizes time & amplitude based arc limits and uniquely applies them to each desired test
• Pico-Amp Leakage Measurement insures that even the lowest leakage current levels are accurately detected and tera-ohm range IR readings are stable and precise
• Test Specific Fixture & Cable Compensation - Automatically calibrate out offset errors caused by lead resistance, fixture capacitance and leakage
• Multi-Mode IR - Insulation Resistance values up to one Tera-ohm can be obtained with precision in your choice of 3 IR test modes - end on time, end on pass or end on fail
• Continuously Variable IR Test Voltage - Unlike most IR testers which limit you to 3 or 4 discrete test voltages, the 950i Series allows you to select the test voltage you need. Starting as low as 20V all the way to 6.5KV, 11KV or 15KVDC
• Capacitance Test Modes - For AC & DC hipot and IR provide tightly controlled charge and discharge profiles for superior results on critical solar panel tests and other highly capacitive loads
• Light Weight Switching Power Supply Design - Better reliability, easier on your back. Compare the 8.2 kg 95X to whatever you've been using
• 400Hz AC Voltage Withstand Testing provides aviation frequency specific test results for a more effective analysis of dielectric properties on avionic components
• Solar Panel Testing Simplified - Designed with PV testing in mind, the 950i Series uses pico-amp resolution to detect minute defects in solar cells
• Safety Tested per EN 61010-1. EMC compliant to EN 61326-1