The TAP2500, TAP3500 and TAP4000 Single-ended Active FET probes provide excellent high-speed electrical and mechanical performance required for today's digital system designs.
Outstanding electrical performance
High probe bandwidth
Fast probe rise time
Excellent signal fidelity
≤0.8 pF input capacitance
40 kΩ input resistance
-4 V to +4 V input dynamic range
-10 V to +10 V DC input offset range
±30 V (DC + peak AC) Maximum input voltage (nondestructive)
Versatile mechanical performance
Small compact probe head for probing small geometry circuit elements
DUT attachment accessories enable connection to SMDs as small as 0.5 mm pitch
Robust design for reliability
Easy to use
Connects directly to oscilloscopes with the TekVPI™ probe interface
Provides automatic units scaling and readout on the oscilloscope display
Easy access to oscilloscope probe menu display for probe status/diagnostic information and to control probe DC offset
Remote GPIB/USB probe control through the oscilloscope
Applications
Verification, debug, and characterization of high-speed designs