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Hioki 3504-50 C Hi-Tester (120Hz & 1kHz) with GP-IB Binning
C Hi-Tester (120Hz & 1kHz) w/GP-IB Binning
Order #: 3504-50
Mfg #: 3504-50
Hioki 3504-50 C Hi-Tester (120Hz & 1kHz) with GP-IB Binning
C Hi-Tester (120Hz & 1kHz) w/GP-IB Binning
Order #: 3504-50
Mfg #: 3504-50
Hioki products are available to ship to customers in the United States only.
Availability:
This item is no longer available. Please contact Transcat Customer Service
for assistance with alternative product suggestions to meet your exact needs.
Product Highlights
- Constant voltage measurement (1V or 500mV)
- Minimum measurement time of 2 ms
- Comparator function BIN function (Max. 14 rank)
- Memory for 99 sets of measurement conditions
- Simple operations that are easy to use plus LED indication
- Trigger-synchronous output function
